Temporal Compressive Sensing Instrumentation for TEM

Advances in compressive sensing (CS) techniques and instrumentation have created a renewed interest in exploring new methods for data collection and post-processing [1,2]. Recently developed Temporal CS (TCS) techniques based on post-specimen, high-speed electrostatic beam deflectors effectively multiply the frame rate of commonly available TEM cameras by pre-compressing video data on the detector prior to readout, enabling much higher frame rates for in situ TEM measurements. In addition to improving camera frame rate, TCS opens up a very powerful set of techniques for electron imaging, diffraction, and spectroscopy by mapping time to other external experimental parameters such as probe position, probe strobe frequency, sample orientation, or sample drift. The TCS system introduced here is capable of precisely modulating or recording these experimental parameters through the same Integrated Timing Unit (ITU) that manages the camera and deflector.